DR Anders Barlow

DR Anders Barlow




  • I am an Academic Specialist within the Materials Characterisation and Fabrication Platform (MCFP) managing the helium ion microscopy node. Much of my background is in the surface analysis of materials with a focus on surface chemical analysis by X-ray photoelectron spectroscopy (XPS), scanning Auger electron microscopy (SAM) and helium ion microscopy (HIM). These fields are brought together in my research, developing our foundation of understanding about the interaction of ion beams with surfaces during chemical analysis and depth profiling, and developing new methods and techniques to leverage these techniques against one another.   


Member of

  • Australian Institute of Physics. Member 2018 -
  • Australian Microscopy and Microanalysis Society. Member 2018 -


Selected publications


Education and training

  • PhD, Flinders University of South Australia 2012
  • BScNano(Hons), Flinders University of South Australia 2007