Evaluation of the characteristics of silicon carbide diodes using transient-IBIC technique Journal Articles Refereed uri icon

Overview

Authors

  • Authorship

    • OHSHIMA T
    • LEE KK
    • ONODA S
    • KAMIYA T
    • OIKAWA M
    • DR Jamie Laird
    • HIRAO T
    • ITOH H

Published in

  • Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

Time

Date/time value

  • 2003

Identity

Digital Object Identifier (DOI)

  • 10.1016/S0168-583X(03)01070-X

Additional Document Info

Parent Title

  • 8th International Conference on Nuclear Microprobe Technology and Applications
  • NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

Volume

  • 210

Publisher

  • Elsevier Science