Distortion in the thermal noise spectrum and quality factor of nanomechanical devices due to finite frequency resolution with applications to the atomic force microscope Journal Articles Refereed uri icon

Overview

Published in

  • Review of Scientific Instruments

Time

Date/time value

  • 2011

Identity

Digital Object Identifier (DOI)

  • 10.1063/1.3632122

Additional Document Info

Parent Title

  • REVIEW OF SCIENTIFIC INSTRUMENTS

Volume

  • 82

Issue

  • 9

Number

  • ARTN 095104

Publisher

  • American Institute of Physics