Effect of multiplicative noise on least-squares parameter estimation with applications to the atomic force microscope Journal Articles Refereed uri icon

Overview

Published in

  • Review of Scientific Instruments

Time

Date/time value

  • 2012

Identity

Digital Object Identifier (DOI)

  • 10.1063/1.4709496

Additional Document Info

Parent Title

  • REVIEW OF SCIENTIFIC INSTRUMENTS

Volume

  • 83

Issue

  • 5

Number

  • ARTN 055106

Publisher

  • American Institute of Physics