Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscope Journal Articles Refereed uri icon

Overview

Published in

  • Ultramicroscopy

Time

Date/time value

  • 2003

Identity

Digital Object Identifier (DOI)

  • 10.1016/S0304-3991(02)00338-8

Additional Document Info

Parent Title

  • ULTRAMICROSCOPY

Volume

  • 94

Issue

  • 3-4

Number

  • PII S0304-3991(02)00338-8

Publisher

  • Elsevier Science