Analytical Field-Effect Method for Extraction of Subgap States in Thin-Film Transistors Journal Articles Refereed uri icon

Overview

Published in

  • IEEE Electron Device Letters

Time

Date/time value

  • 2012

Identity

Digital Object Identifier (DOI)

  • 10.1109/LED.2012.2193657

Additional Document Info

Parent Title

  • IEEE ELECTRON DEVICE LETTERS

Volume

  • 33

Issue

  • 7

Publisher

  • IEEE - Institute of Electrical and Electronic Engineers