Defect-induced performance degradation of 4H-SiC Schottky barrier diode particle detectors Journal Articles Refereed uri icon

Overview

Authors

  • Authorship

Published in

  • Journal of Applied Physics

Time

Date/time value

  • 2013

Identity

Digital Object Identifier (DOI)

  • 10.1063/1.4801797

Additional Document Info

Parent Title

  • JOURNAL OF APPLIED PHYSICS

Volume

  • 113

Issue

  • 14

Number

  • ARTN 143714

Publisher

  • American Institute of Physics