Depth profiling organic/inorganic interfaces by argon gas cluster ion beams: sputter yield data for biomaterials, in-vitro diagnostic and implant applications Journal Articles uri icon

Overview

Published in

  • Surface and Interface Analysis

Time

Date/time value

  • 2013

Identity

Digital Object Identifier (DOI)

  • 10.1002/sia.5333

Additional Document Info

Parent Title

  • SURFACE AND INTERFACE ANALYSIS

Volume

  • 45

Issue

  • 13

Publisher

  • John Wiley & Sons