Damage in III-V compounds during focused ion beam milling Conference Proceedings uri icon

Overview

Published in

  • Microscopy and Microanalysis

Time

Date/time value

  • 2005

Identity

Digital Object Identifier (DOI)

  • 10.1017/S1431927050294

Additional Document Info

Parent Title

  • 9th Conference on Frontiers of Electron Microscopy in Materials Science
  • MICROSCOPY AND MICROANALYSIS

Volume

  • 11

Issue

  • 5

Publisher

  • Cambridge University Press