Adaptive Scan for Atomic Force Microscopy Based on Online Optimization: Theory and Experiment Journal Articles Refereed uri icon

Overview

Published in

  • IEEE Transactions on Control Systems Technology

Time

Date/time value

  • 2019

Identity

Digital Object Identifier (DOI)

  • 10.1109/TCST.2019.2895798

Additional Document Info

Parent Title

  • IEEE Transactions on Control Systems Technology

Publisher

  • IEEE Control Systems Society