Displacement damage degradation of ion-induced charge in Si pin photodiode Conference Proceedings uri icon

Overview

Authors

  • Authorship

    • ONODA S
    • HIRAO T
    • DR Jamie Laird
    • MORI H
    • ITOH H
    • WAKASA T
    • OKAMOTO T
    • KOIZUMI Y

Published in

  • Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

Time

Date/time value

  • 2003

Identity

Digital Object Identifier (DOI)

  • 10.1016/S0168-583X(03)00790-0

Additional Document Info

Parent Title

  • 13th International Conference on Ion Beam Modification of Materials
  • NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

Volume

  • 206

Publisher

  • Elsevier Science