Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope Journal Articles Refereed uri icon

Overview

Published in

  • Review of Scientific Instruments

Time

Date/time value

  • 2014

Identity

Digital Object Identifier (DOI)

  • 10.1063/1.4900864

Additional Document Info

Parent Title

  • 20th Topical Conference on High-Temperature Plasma Diagnostics
  • REVIEW OF SCIENTIFIC INSTRUMENTS

Volume

  • 85

Issue

  • 11

Number

  • ARTN 113702

Publisher

  • American Institute of Physics