Indium tin oxide film characterization using the classical Hall Effect Full Written Papers Refereed uri icon

Overview

Time

Date/time value

  • 2014

Identity

International Standard Book Number (ISBN) 13

  • 978-1-4799-6868-8

Additional Document Info

Parent Title

  • 2014 CONFERENCE ON OPTOELECTRONIC AND MICROELECTRONIC MATERIALS AND DEVICES (COMMAD 2014)
  • 2014 Conference on Optoelectronic and Microelectronic Materials & Devices (COMMAD)
  • Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2014 Conference on

Publisher

  • IEEE