Topographical structure of MBE grown cubic InxGa1-xN films studied with a MeV ion microprobe and by AFM Conference Proceedings uri icon

Overview

Published in

  • Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

Time

Date/time value

  • 2000

Identity

Digital Object Identifier (DOI)

  • 10.1016/S0168-583X(99)00883-6

Additional Document Info

Parent Title

  • 14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology
  • NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

Volume

  • 161

Publisher

  • Elsevier Science