Time resolved reflectivity measurements of the amorphous-to-gamma and gamma-to-alpha phase transitions in ion-implanted Al2O3

Abstract

Time resolved optical reflectivity (TRR) has been used to measure the growth kinetics associated with the amorphous-to-gamma and gamma-to-alpha phase transitions in ion-beam amorphised c-axis oriented α-Al2O3. The optical reflectivity technique allows the recrystallisation behaviour to be monitored dynamically during regrowth so that the growth kinetics associated with the two phase transitions can be measured simply and accurately from a relatively small number of samples. The amorphous-to-gamma and gamma-to-alpha phase transitions were studied over the temperature ranges of 670-770°C and 900-1070°C, respectively. The growth kinetics obtained for the two transitions are compared to previous..