Journal article

Finite sample properties of linear model identification

E Weyer, RC Williamson, IMY Mareels

IEEE Transactions on Automatic Control | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | Published : 1999

DOI: 10.1109/9.774109

University of Melbourne Researchers

Erik Weyer Author Electrical and Electronic Engineering

Iven Mareels Author Electrical and Electronic Engineering

Citation metrics

17Web of Science

Keywords

Finite Sample Properties

Engineering, Electrical & Electronic

Least Squares System Identification

Risk Minimization Theory

Automation & Control Systems

Science & Technology