Conference Proceedings

Effects of circuit-level stress on inverter performance and MOSFET characteristics

N Stutzke, BJ Cheek, S Kumar, RJ Baker, AJ Moll, WB Knowlton

IEEE International Integrated Reliability Workshop Final Report, 2003 | Published : 2003

DOI: 10.1109/IRWS.2003.1283304

University of Melbourne Researchers

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