Structure retrieval with fast electrons using segmented detectors

HG Brown; AJ D'Alfonso; Z Chen; AJ Morgan; M Weyland; C Zheng; MS Fuhrer; SD Findlay; LJ Allen

Journal article

Structure retrieval with fast electrons using segmented detectors

HG Brown, AJ D'Alfonso, Z Chen, AJ Morgan, M Weyland, C Zheng, MS Fuhrer, SD Findlay, LJ Allen

Physical Review B | AMER PHYSICAL SOC | Published : 2016

DOI: 10.1103/PhysRevB.93.134116

Abstract

We introduce an algorithm for the reconstruction of the complex transmission function of a specimen using segmented detectors in scanning transmission electron microscopy geometry. The phase of the transmission function can be related to magnetic and electric fields within the specimen and is sensitive to lighter elements. The technique is demonstrated for simulated data and also using experimental datasets taken from a MoS2 monolayer and a SrTiO3 crystal. We present an extension to the algorithm to account for uncertainties in the illuminating probe. The algorithm can be implemented using fast Fourier transforms, and this provides the possibility of reconstructing specimen transmission func..

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University of Melbourne Researchers

Hamish Galloway Brown Author

Les J. Allen Author

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Grants

Awarded by Australian Research Council

Funding Acknowledgements

The authors wish to thank Peter Ercius and Jim Ciston for their assistance during the experiments, and Peter Nellist and Hao Yang for helpful discussions. This research was supported under the Australian Research Council's Discovery Projects funding scheme (Projects No. DP110102228, No. DP140102538, and No. DP150103837), the Australian Laureate Fellowships funding scheme (FL120100038), and the Discovery Early Career Researcher Awards funding scheme (Projects No. DE130100739 and No. DE140101555). Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, Office of the US Department of Energy under Contract No. DE-AC02-05CH11231. The Monash Centre for Electron Microscopy is acknowledged for providing facilities for sample preparation, initial microscopy, and data handling.