X-ray phase-contrast microscopy of paper
TE Gureyev, R Evans, AW Stevenson, DC Gao, SW Wilkins
TAPPI JOURNAL | TECH ASSN PULP PAPER IND INC | Published : 2001
The authors report the first results of a feasibility study of in-line hard X-ray phase-contrast microscopy (IXPCM) of paper samples using a laboratory micro-focus X-ray source. It's demonstrate that the phase-contrast techniques may have considerable advantanges over conventional absorption-based radiographs for imaging samples that consist mostly of light chemical elements. The information content and the nature of image contrast has been analyzed in IXPCM and compared with ordinary and confocal visible light microscopy and beta-radiography.