Conference Proceedings

An SEM-based X-ray microtomography system

PR Miller, SC Mayo, T Gureyev, SW Wilkins, J Sheffield-Parker

Microscopy and Microanalysis | Published : 2006

DOI: 10.1017/S1431927606067420

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

University of Melbourne Researchers

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Keywords

40 Engineering
4016 Materials Engineering