Journal article
X-RAY-DIAGNOSTICS OF THE ELASTIC STRESS GRADIENT IN CRYSTALS
VV ARISTOV, TE GOUREEV, AY NIKULIN, AA SNIGIREV
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | AKADEMIE VERLAG GMBH | Published : 1991
Abstract
Experimental and computer simulation results of X‐ray diffraction investigation of the influence of the elastic stress gradient of the periodically distorted near‐surface region in the silicon single crystal on the tail intensity of differential rocking curves are presented. The possibility of measuring this gradient using X‐ray diffraction data is shown. Copyright © 1991 WILEY‐VCH Verlag GmbH & Co. KGaA