Journal article

Secondary electron emission from boron-doped diamond under ion impact: Applications in single-ion detection

T Kamiya, M Cholewa, A Saint, S Prawer, GJF Legge, JE Butler, DJ Vestyck

APPLIED PHYSICS LETTERS | AMER INST PHYSICS | Published : 1997

Abstract

The secondary electron emission from a 2 μm thick boron-doped diamond film under ion (4.6-7.7 MeV He+)impact is reported. The yield under ions impact is found to be remarkably high, stable over a period of many months, and independent of which side of the film (i.e., growth or substrate side) is exposed to the ion flux. By taking advantage of the high secondary-electron yield, the passage of each ion through the film could be detected with an efficiency of close to 100%, which to the best of our knowledge is the highest efficiency recorded to date for any thin-film window. This finding has an immediate application in single-ion irradiation systems where a thin vacuum window is required to al..

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University of Melbourne Researchers