Conference Proceedings

Edge-on face-to-face MOSFET for synchrotron microbeam dosimetry: MC modeling

AB Rosenfeld, EA Siegbahn, E Brauer-Krish, A Holmes-Siedle, MLF Lerch, A Bravin, IM Cornelius, GJ Takacs, N Painuly, H Nettelback, T Kron

IEEE Transactions on Nuclear Science | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | Published : 2005