Conference Proceedings

Edge-on face-to-face MOSFET for synchrotron microbeam dosimetry: MC modeling

AB Rosenfeld, EA Siegbahn, E Brauer-Krish, A Holmes-Siedle, MLF Lerch, A Bravin, IM Cornelius, GJ Takacs, N Painuly, H Nettelback, T Kron

IEEE Transactions on Nuclear Science | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | Published : 2005

DOI: 10.1109/TNS.2005.860704

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Keywords

Science & Technology
Synchrotron
Dosimetry
Charged-Particle Equilibrium (cpe)
Radiotherapy
Spatial-Resolution
Technology
Low-Energy
Microbeam
Engineering, Electrical & Electronic
Devices
Mosfet
Dose Enhancement Effects (dees)
Engineering
Nuclear Science & Technology