A vector measurement scheme for testing quasi-optical components

Abstract

A quasi-optical vector network analyzer has been developed and used to conduct a study of the complex reflection coefficients of planar structures. Good agreement has been obtained between theory and experiment for both amplitude and phase measurements at millimeter/microwave frequencies. A narrow band filter consisting of an array of annular slots in a metallic screen with a transmission peak at 35 GHz has been fabricated and tested over the range 26.5-40 GHz. © 1990 Plenum Publishing Corporation.