Phase measurement of atomic resolution image using transport of intensity equation.
Kazuo Ishizuka, Brendan Allman
Microscopy | Published : 2005
Since the Transport Intensity Equation (TIE) has been applied to electron microscopy only recently, there are controversial discussions in the literature regarding the theoretical concepts underlying the equation and the practical techniques to solve the equation. In this report we explored some of the issues regarding the TIE, especially bearing electron microscopy in mind, and clarified that: (i) the TIE for electrons exactly corresponds to the Schrödinger equation for high-energy electrons in free space, and thus the TIE does not assume weak scattering; (ii) the TIE can give phase information at any distance from the specimen, not limited to a new field; (iii) information transfer in the ..View full abstract