Percent-level accuracy in measuring strong-field photoionization and laser intensity

WC Wallace, O Ghafur, C Khurmi, U Satya Sainadh, JE Calvert, DE Laban, MG Pullen, IV Litvinyuk, RT Sang, D Kielpinski, K Bartschat, AN Grum-Grzhimailo, D Wells, HM Quiney, XM Tong