Conference Proceedings
Detection of faulty semiconductor wafers using dynamic growing self organizing map
G Russ, R Kruse, AA Karim, AL Hsu, S Halgamuge, Aa Smith, A Islam
TENCON 2005 - 2005 IEEE REGION 10 CONFERENCE, VOLS 1-5 | IEEE | Published : 2006
Grants
Funding Acknowledgements
Partial funding from the Australian Research Council (ARC) is appreciated.