Journal article

Monitoring fluctuations at a synchrotron beamline using matched ion chambers: 2. isolation of component noise sources, and application to attenuation measurements showing increased precision by two orders of magnitude

CT Chantler, CQ Tran, D Paterson, DJ Cookson, Z Barnea

X-Ray Spectrometry | JOHN WILEY & SONS LTD | Published : 2000