Journal article
Photographic response to x-ray irradiation. II: Correlated models
CT Chantler
Applied Optics | OPTICAL SOC AMER | Published : 1993
DOI: 10.1364/AO.32.002398
Abstract
In this paper models from the first paper are generalized so that they include the correlation of attenuation coefficients and coverages with emulsion depth. They avoid further assumptions and can provide physically meaningful parameters (as opposed to earlier studies); thus closer agreement with experimental measurements is obtained. The difficulty in estimating correlated overlap functions is discussed. Error estimates resulting from grain statistics are generalized and computed in a selfconsistent manner. Contributions to granularity from densitometer and grain statistics have been shown to be significant or dominant in most emulsion types. The formulation derives reliable error estimates..
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