Flat and curved crystal spectrography for mammographic X-ray sources
CT Chantler, RD Deslattes, A Henins, LT Hudson
BRITISH JOURNAL OF RADIOLOGY | BRITISH INST RADIOLOGY | Published : 1996
The demand for improved spectral understanding of mammographic X-ray sources and non-invasive voltage calibration of such sources has led to research into applications using curved crystal spectroscopy. Recent developments and the promise of improved precision and control are described. Analytical equations are presented to indicate effects of errors and alignment problems in the flat and curved crystal systems. These are appropriate for all detection systems. Application to and testing of spectrographic detection (using standard X-ray film) is presented. Suitable arrangements exist which can be used to measure X-ray tube voltages well below 1 kV precision in the operating range of 20-35 kV.