Journal article

Calibration of atomic force microscope cantilevers using standard and inverted static methods assisted by FIB-milled spatial markers

Ashley D Slattery, Adam J Blanch, Jamie S Quinton, Christopher T Gibson

Nanotechnology | IOP PUBLISHING LTD | Published : 2013

University of Melbourne Researchers


Funding Acknowledgements

The authors thank the Australian Microscopy and Microanalysis Facility for their support and Adelaide Microscopy, in particular Len Green, for assistance with the Helios D433 Dualbeam microscope.