Pulsed-voltage atom probe tomography of low conductivity and insulator materials by application of ultrathin metallic coating on nanoscale specimen geometry
Vahid R Adineh, Ross KW Marceau, Yu Chen, Kae J Si, Tony Velkov, Wenlong Cheng, Jian Li, Jing Fu
Ultramicroscopy | ELSEVIER SCIENCE BV | Published : 2017
Awarded by Australian National Health & Medical Research Council (NHMRC)
Awarded by National Institute of Allergy and Infectious Diseases of the National Institutes of Health
Awarded by Australian Research Council (ARC)
This study was funded by the Australian National Health & Medical Research Council (NHMRC, APP1046561), Monash University Interdisciplinary Research (IDR) Seed Fund, and the Monash Centre for Atomically Thin Materials (MCATM) (for PhD top-up scholarship). This work was performed in part at the Melbourne Centre for Nanofabrication (MCN), Victorian Node of the Australian National Fabrication Facility (ANFF). Also, the authors acknowledge use of facilities within the Monash Centre for Electron Microscopy (MCEM), and the Advanced Characterization Facility within the Institute for Frontier Materials (IFM) at Deakin University. J.L. and T.V are supported by research grants from the National Institute of Allergy and Infectious Diseases of the National Institutes of Health (R01 AI098771 and AI111965). The content is solely the responsibility of the authors and does not necessarily represent the official views of the National Institute of Allergy and Infectious Diseases or the National Institutes of Health. J.L. is an Australian NHMRC Senior Research Fellow. T.V. is an Australian NHMRC Industry Career Development Level 2 Research Fellow. This research used equipment funded by Australian Research Council (ARC) grants (LE0882821, LE110100223, and LE120100034). The authors would like to thank Drs Amelia Liu, Flame Burgmann, Boyin Liu, Jisheng Ma and Mr Renji Pan for their assistance during this study.