Journal article
XPSSurfA: An open collaborative XPS data repository using the CMSShub platform
AJ Barlow, RT Jones, AJ McDonald, PJ Pigram
Surface and Interface Analysis | WILEY | Published : 2018
DOI: 10.1002/sia.6417
Open access
Abstract
X-ray photoelectron spectroscopy (XPS) is a widely used surface analysis technique employed in fundamental research, applied research, service laboratories, and industry. Good-quality analytical outcomes depend critically on spectral references. Many examples of XPS reference databases exist, including print editions, sets of spectral peak positions drawn from the literature, and digital archives and libraries. We report the development of a new digital XPS database comprising survey spectra and region spectra for a range of materials types, collected under a common set of analytical conditions. Each material is described using spectra collected at multiple pass energies with all photoelectr..
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Awarded by Australian National Data Service
Funding Acknowledgements
Australian National Data Service, Grant/Award Number: Agreement HVC02; Australian National Fabrication Facility