Journal article

Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode

Ashley D Slattery, Cameron J Shearer, Joseph G Shapter, Adam J Blanch, Jamie S Quinton, Christopher T Gibson

Nanomaterials | MDPI | Published : 2018

DOI: 10.3390/nano8100807

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University of Melbourne Researchers

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Keywords

Afm Probes
Imaging Artefacts
Carbon Nanotubes
Technology
Scanning Probe
Chemistry, Multidisciplinary
Physical Sciences
Materials Science
Dynamics
Science & Technology
Materials Science, Multidisciplinary
Chemistry
Nanoscience & Nanotechnology
Resolution
Attachment
Atomic Force Microscope Tips
Tapping Mode
Science & Technology - Other Topics
Tips
Direct Growth
Fabrication
Peakforce Tapping Mode