Journal article

Effects of gamma and heavy ion damage on the impulse response and pulsed gain of a low breakdown voltage Si avalanche photodiode

Jamie S Laird, Shinobu Onoda, Toshio Hirao, Heidi Becker, Allan Johnston, Hisayoshi Itoh

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | Published : 2006

DOI: 10.1109/TNS.2006.886042

University of Melbourne Researchers

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Keywords

Dependence
Technology
Engineering
Science & Technology
Degradation
Nuclear Science & Technology
Apd
Radiation-Damage
Engineering, Electrical & Electronic
Proton Irradiation
Silicon Detectors