Journal article

Transient currents generated by heavy ions with hundreds of MeV

S Onoda, T Hirao, JS Laird, K Mishima, K Kawano, H Itoh

IEEE Transactions on Nuclear Science | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | Published : 2006

DOI: 10.1109/TNS.2006.885384

University of Melbourne Researchers

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Keywords

Silicon
System
Nuclear Science & Technology
Science & Technology
Upset
Engineering, Electrical & Electronic
Charge Collection
Energy Deposition
Tracks
Diodes
Current
Single Event Transient (set)
Devices
Microbeam
Engineering
Transient Ion Beam Induced Current (tibic)
Collimated Beam
Technology