Journal article

Enhancing the critical current of YBa2Cu3O7 thin films by substrate nanoengineering

A Jones, SKH Lam, J Du, S Rubanov, AV Pan



The critical current density, J c, can be increased by introducing defects throughout YBa 2Cu 3O 7 superconducting thin films. We propose a new approach of substrate nanoengineering to produce well-controlled defects. LaAlO 3 substrates have been ion-etched with different 34 nm deep patterns prior to the deposition of the films. An annealing step at 1000 °C after substrate etching has been undertaken to negate the Ar-ion damage to the surface. The J c of the so-prepared samples measured at different temperatures has been compared to thin films deposited on plain substrates at the same time. In general, an increase in J c is observed across all temperatures and fields as a result of both patt..

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University of Melbourne Researchers


Awarded by eCOST Action

Funding Acknowledgements

This work is supported by the Faculty of Engineering and Information Sciences and Australian Institute for Innovative Materials (University of Wollongong, Australia) and the Australian Government Research Training Program Award. A. Jones has benefited from CSIRO postgraduate top-up scholarship. The authors would like to thank I. Rudnev, W. A. Ortiz, and V. V. Moshchalkov for stimulating discussions, as well as eCOS T Action MP1201 on Nanoscale Superconductivity for a supportive research environment.