Conference Proceedings
Characterization and volume test of the AM06 chip
SR Shojaii, A Annovi, D Banfi, M Beretta, F Crescioli, L Frontini, V Liberali, L Marcellino, A Stabile
14th IMEKO TC10 Workshop on Technical Diagnostics 2016: New Perspectives in Measurements, Tools and Techniques for Systems Reliability, Maintainability and Safety | Published : 2016