Conference Proceedings
Testing of Interposer-Based 2.5D Integrated Circuits
Ran Wang, Krishnendu Chakrabarty
PROCEEDINGS 2016 IEEE INTERNATIONAL TEST CONFERENCE (ITC) | IEEE | Published : 2016
Grants
Awarded by Semiconductor Research Corporation (SRC)
Funding Acknowledgements
This research was supported in part by the Semiconductor Research Corporation (SRC) under contract no. 2470.