Conference Proceedings

Testing of Interposer-Based 2.5D Integrated Circuits

Ran Wang, Krishnendu Chakrabarty

PROCEEDINGS 2016 IEEE INTERNATIONAL TEST CONFERENCE (ITC) | IEEE | Published : 2016

Grants

Awarded by Semiconductor Research Corporation (SRC)


Funding Acknowledgements

This research was supported in part by the Semiconductor Research Corporation (SRC) under contract no. 2470.