Journal article
Thickness-Dependent Characterization of Chemically Exfoliated TiS2 Nanosheets
PC Sherrell, K Sharda, C Grotta, J Ranalli, MS Sokolikova, FM Pesci, P Palczynski, VL Bemmer, C Mattevi
ACS Omega | AMER CHEMICAL SOC | Published : 2018
Open access
Abstract
Monolayer TiS2 is the lightest member of the transition metal dichalcogenide family with promising applications in energy storage and conversion systems. The use of TiS2 has been limited by the lack of rapid characterization of layer numbers via Raman spectroscopy and its easy oxidation in wet environment. Here, we demonstrate the layer-number-dependent Raman modes for TiS2. 1T TiS2 presents two characteristics of the Raman active modes, A1g (out-of-plane) and Eg (in-plane). We identified a characteristic peak frequency shift of the Eg mode with the layer number and an unexplored Raman mode at 372 cm-1 whose intensity changes relative to the A1g mode with the thickness of the TiS2 sheets. Th..
View full abstractGrants
Awarded by Engineering and Physical Sciences Research Council
Funding Acknowledgements
The authors acknowledge the use of characterization facilities within the Harvey Flower Electron Microscopy Suite, XRD suite, and AFM suite, Department of Materials, Imperial College London. M.S.S. would like to acknowledge the President's PhD Scholarship programme at Imperial College London for financial support. C.M. would like to acknowledge the EPSRC awards, EP/K01658X/1, EP/K016792/1, and EP/M022250/1, the EPSRC-Royal Society Fellowship Engagement Grant EP/L003481/1, and the award of a Royal Society University Research Fellowship by the UK Royal Society.