Conference Proceedings
Experimental study of single-event transient current in SOI devices
T Hirao, T Shibata, JS Laird, S Onoda, Y Takahashi, K Ohnishi, T Kamiya, R Sharp, K Fletcher
PROCEEDINGS OF THE 7TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS | ESA PUBLICATIONS DIVISION C/O ESTEC | Published : 2004