Conference Proceedings

Experimental study of single-event transient current in SOI devices

T Hirao, T Shibata, JS Laird, S Onoda, Y Takahashi, K Ohnishi, T Kamiya, R Sharp, K Fletcher

PROCEEDINGS OF THE 7TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS | ESA PUBLICATIONS DIVISION C/O ESTEC | Published : 2004