Conference Proceedings
Characterization of charge generated in silicon carbide n( ) p diodes using transient ion beam-induced current
T Ohshima, T Satoh, M Oikawa, T Yamakawa, S Onoda, T Wakasa, JS Laird, T Hirao, T Kamiya, H Itoh, A Kinoshita, R Tanaka, I Nakano, M Iwami, Y Fukushima
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | ELSEVIER SCIENCE BV | Published : 2005