Conference Proceedings

A system for ultra-fast transient ion and pulsed laser current microscopies as a function of temperature

JS Laird, T Hirao, S Onoda, H Mori, H Itoh, H Tomokage (ed.), T Sekiguchi (ed.)

BEAM INJECTION ASSESSMENT OF MICROSTRUCTURES IN SEMICONDUCTORS, 2000 | TRANS TECH PUBLICATIONS LTD | Published : 2000