Journal article

Microscopic Imaging of the Stress Tensor in Diamond Using in Situ Quantum Sensors

DA Broadway, BC Johnson, MSJ Barson, SE Lillie, N Dontschuk, DJ McCloskey, A Tsai, T Teraji, DA Simpson, A Stacey, JC McCallum, JE Bradby, MW Doherty, LCL Hollenberg, J-P Tetienne

NANO LETTERS | AMER CHEMICAL SOC | Published : 2019

Abstract

The precise measurement of mechanical stress at the nanoscale is of fundamental and technological importance. In principle, all six independent variables of the stress tensor, which describe the direction and magnitude of compression/tension and shear stress in a solid, can be exploited to tune or enhance the properties of materials and devices. However, existing techniques to probe the local stress are generally incapable of measuring the entire stress tensor. Here, we make use of an ensemble of atomic-sized in situ strain sensors in diamond (nitrogen-vacancy defects) to achieve spatial mapping of the full stress tensor, with a submicrometer spatial resolution and a sensitivity of the order..

View full abstract

Grants

Awarded by Australian Research Council (ARC)


Awarded by CREST of JST, Japan



Funding Acknowledgements

We acknowledge support from the Australian Research Council (ARC) through grants DE170100129, CE170100012, FL130100119, and DP170102735. This work was performed in part at the Materials Characterisation and Fabrication Platform (MCFP) at the University of Melbourne and the Victorian Node of the Australian National Fabrication Facility (ANFF). This work was performed in part at the Melbourne Centre for Nanofabrication (MCN) in the Victorian Node of the Australian National Fabrication Facility (ANFF). We acknowledge the AFAiiR node of the NCRIS Heavy Ion Capability for access to ion-implantation facilities. D.A.B., S.E.L., D.J.M., and A.T. are supported by an Australian Government Research Training Program Scholarship. T.T. acknowledges the support of Grants-in-Aid for Scientific Research (Grant Nos. 15H03980, 26220903, and 16H06326), the Q-LEAP "Quantum Metrology & Sensing" of MEXT, Japan, and CREST (Grant No. JPMJCR1773) of JST, Japan.