Journal article

Mass measurement of graphene using quartz crystal microbalances

Robin J Dolleman, Mick Hsu, Sten Vollebregt, John E Sader, Herre SJ van der Zant, Peter G Steeneken, Murali K Ghatkesar

APPLIED PHYSICS LETTERS | AMER INST PHYSICS | Published : 2019

Abstract

Current wafer-scale fabrication methods for graphene-based electronics and sensors involve the transfer of single-layer graphene by a support polymer. This often leaves some polymer residue on the graphene, which can strongly impact its electronic, thermal, and mechanical resonance properties. To assess the cleanliness of graphene fabrication methods, it is thus of considerable interest to quantify the amount of contamination on top of the graphene. Here, we present a methodology for the direct measurement of the mass of the graphene sheet using quartz crystal microbalances (QCMs). By monitoring the QCM resonance frequency during removal of graphene in an oxygen plasma, the total mass of the..

View full abstract

University of Melbourne Researchers

Grants

Awarded by Netherlands Organisation for Scientific Research (NWO)


Awarded by European Union's Horizon 2020 research and innovation programme


Awarded by Australian Research Council Centre of Excellence in Exciton Science


Funding Acknowledgements

The authors thank Applied Nanolayers B.V. for supply and transfer of the single-layer graphene and Hugo Solera Licona for help with cleaning the crystals. This work is part of the research programme Integrated Graphene Pressure Sensors (IGPS) with Project No. 13307 which is financed by the Netherlands Organisation for Scientific Research (NWO). The research leading to these results also received funding from the European Union's Horizon 2020 research and innovation programme under Grant Agreement No. 785219 Graphene Flagship. The authors acknowledge support from the Australian Research Council Centre of Excellence in Exciton Science (No. CE170100026) and the Australian Research Council Grants Scheme.