Conference Proceedings

Thermal Factors Influencing the Reliability of GaN HEMTs

Jason A Carter, Jeremy Acord, Daniel Hoffmann, Andrew Trageser, Charles Pagel

2012 28TH ANNUAL IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM (SEMI-THERM) | IEEE | Published : 2012

University of Melbourne Researchers

Grants

Awarded by Crane Division through the Naval Sea Systems Command


Funding Acknowledgements

This material is based upon work supported by Naval Surface Warfare Center, Crane Division through the Naval Sea Systems Command under Contract No. N00164-09-C-GR34.