Thermal Factors Influencing the Reliability of GaN HEMTs
Jason A Carter, Jeremy Acord, Daniel Hoffmann, Andrew Trageser, Charles Pagel
2012 28TH ANNUAL IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM (SEMI-THERM) | IEEE | Published : 2012
Awarded by Crane Division through the Naval Sea Systems Command
This material is based upon work supported by Naval Surface Warfare Center, Crane Division through the Naval Sea Systems Command under Contract No. N00164-09-C-GR34.