Active Semi-supervised Defect Categorization

Abstract

Defects are inseparable part of software development and evolution. To better comprehend problems affecting a software system, developers often store historical defects and these defects can be categorized into families. IBM proposes Orthogonal Defect Categorization (ODC) which include various classifications of defects based on a number of orthogonal dimensions (e.g., Symptoms and semantics of defects, root causes of defects, etc.). To help developers categorize defects, several approaches that employ machine learning have been proposed in the literature. Unfortunately, these approaches often require developers to manually label a large number of defect examples. In practice, manually label..