Activation and electron spin resonance of near-surface implanted bismuth donors in silicon

Abstract

The bismuth (Bi) substitutional donor in silicon (Si) is an attractive qubit candidate for quantum computing proposals due to its large Hilbert space, clock transitions, and potential to couple to superconducting flux qubits. Single-qubit control, coupling, and readout by surface nanocircuitry requires a Bi depth of ∼20 nm in Si. This can be achieved using ion implantation of ∼25 keV Bi. This work explores the activation properties of Bi implanted at 26 keV with fluences of 1×1014 and 6×1012cm-2 into both crystalline and preamorphized Si. The Bi electrical activation yield was measured over a broad range of annealing conditions using resistivity and Hall effect measurements, enabling optimal..