Journal article

EM-net: Deep learning for electron microscopy image segmentation

Afshin Khadangi, Thomas Boudier, Vijay Rajagopal

Cold Spring Harbor Laboratory | Published : 2020


Abstract Recent high-throughput electron microscopy techniques such as focused ion-beam scanning electron microscopy (FIB-SEM) provide thousands of serial sections which assist the biologists in studying sub-cellular structures at high resolution and large volume. Low contrast of such images hinder image segmentation and 3D visualisation of these datasets. With recent advances in computer vision and deep learning, such datasets can be segmented and reconstructed in 3D with greater ease and speed than with previous approaches. However, these methods still rely on thousands of ground-truth samples for training and electron microscopy datasets require significant amounts of time for carefully c..

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University of Melbourne Researchers

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