Measurement of R(D) and R(D*) with a Semileptonic Tagging Method
G Caria, P Urquijo, I Adachi, H Aihara, S Al Said, DM Asner, H Atmacan, T Aushev, V Babu, I Badhrees, S Bahinipati, AM Bakich, P Behera, C Beleno, J Bennett, B Bhuyan, T Bilka, J Biswal, A Bozek, M Bracko Show all
Physical Review Letters | AMER PHYSICAL SOC | Published : 2020
We thank the KEKB group for excellent operation of the accelerator; the KEK cryogenics group for efficient solenoid operations; and the KEK computer group, the NII, and PNNL/EMSL for valuable computing and SINET5 network support. We acknowledge support from MEXT, JSPS and Nagoya's Tau-Lepton Physics Research Center of Nagoya University (TLPRC); ARC (Australia); FWF (Austria); NSFC and CAS Center for Excellence in Particle Physics(CCEPP) (China); MSMT (Czechia); Carl Zeiss Foundation (CZF), DFG, Excellence Cluster Universe (EXC153), and VolkswagenStiftung (VS) (Germany); DST (India); INFN (Italy); MOE, MSIP, NRF, Radiation Science Research Institute (RSRI), Foreign Large-size Research Facility Application Supporting project (FLRFAS) project, GSDC of KISTI and KREONET/GLORIAD (Korea); MNiSW and NCN (Poland), Agreement No. 14.W03.31.0026 (Russia); ARRS (Slovenia); IKERBASQUE (Spain); SNSF (Switzerland); MOE and MOST (Taiwan); and DOE and NSF (U.S.A.). We acknowledge the support provided by the Albert Shimmins Fund for the writing of this Letter.